Quantitative impedance measurement using atomic force microscopy

Obtaining quantitative electrical information with scanning probe microscopy techniques poses a significant challenge since the nature of the probe/sample contact is frequently unkown. For example, obtaining quantitative kinetic data from the recently developed atomic force microscopy (AFM) impedanc...

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Journal Title: Journal of Applied Physics Vol. 96; no. 9; pp. 3540 -
Authors: Gang Feng, William Nix, Ryan O'Hayre, Fritz Prinz
Format: Article
Language: English
Published: 09/15/2004
Subjects:
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