Quantitative impedance measurement using atomic force microscopy
Obtaining quantitative electrical information with scanning probe microscopy techniques poses a significant challenge since the nature of the probe/sample contact is frequently unkown. For example, obtaining quantitative kinetic data from the recently developed atomic force microscopy (AFM) impedanc...
|Journal Title:||Journal of Applied Physics Vol. 96; no. 9; pp. 3540 -|
|Authors:||Gang Feng, William Nix, Ryan O'Hayre, Fritz Prinz|