Raman spectroscopy and X-ray diffraction studies of stress effects in PbTiO3 thin films

A systematic study of domain structure and residual stress evolution with film thickness and of phase transition in c/a epitaxial PbTiO3/LaAlO3 films using X-ray diffraction and Raman spectroscopy is reported. Both techniques revealed that the films are under tensile residual stress in the film plan...

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Journal Title: IEEE Transactions On Ultrasonics Ferroelectrics And Frequency Control Vol. 54; no. 12; pp. 2623 - 2631
Authors: Ausrine Bartasyte, Odette Chaix-Pluchery, Jens Kreisel, Jose Santiago, Samuel Margueron, Michael Boudard, Carmen Jimenez, Adulfas Abrutis, Francois Weiss
Format: Article
Published: Dec 2007
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